34 results
D133 X-ray Diffraction at IBM - Invited
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- Journal:
- Powder Diffraction / Volume 18 / Issue 2 / June 2003
- Published online by Cambridge University Press:
- 20 May 2016, p. 179
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D-61 Invited—Toward Nanometer Resolution for Strain Mapping in Single Crystals: New Focusing Optics and Dynamical Diffraction Artifacts
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- Journal:
- Powder Diffraction / Volume 22 / Issue 2 / June 2007
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- 20 May 2016, p. 180
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D105 Effect of Beam Divergence on Strain Data from Neutron Diffraction
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- Powder Diffraction / Volume 18 / Issue 2 / June 2003
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- 20 May 2016, p. 178
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D123 Strain Effects in Thin Film / SI Substrates Revealed by X-ray Microdiffraction
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- Powder Diffraction / Volume 18 / Issue 2 / June 2003
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- 20 May 2016, p. 176
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D-109 Sampling Volume Concerns in Micro X-ray Diffraction—Invited
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- Powder Diffraction / Volume 19 / Issue 2 / June 2004
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- 20 May 2016, p. 203
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D-104 Inverse Analysis of Neutron Diffraction Data
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- Journal:
- Powder Diffraction / Volume 22 / Issue 2 / June 2007
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- 20 May 2016, p. 182
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Strain effects in thin film/Si substrates revealed by X-ray microdiffraction
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- Powder Diffraction / Volume 19 / Issue 1 / March 2004
- Published online by Cambridge University Press:
- 06 March 2012, pp. 56-59
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Measurement volume considerations in X-ray microdiffraction stress analysis
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- Powder Diffraction / Volume 19 / Issue 2 / June 2004
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- 06 March 2012, pp. 104-109
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Spatially transient stress effects in thin films by X-ray diffraction
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- Powder Diffraction / Volume 20 / Issue 2 / June 2005
- Published online by Cambridge University Press:
- 01 March 2012, pp. 112-116
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Mechanics of microelectronics structures as revealed by X-ray diffraction
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- Powder Diffraction / Volume 22 / Issue 2 / June 2007
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- 01 March 2012, pp. 98-102
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Nanoscale strain characterization in microelectronic materials using X-ray diffraction
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- Powder Diffraction / Volume 25 / Issue 2 / June 2010
- Published online by Cambridge University Press:
- 29 February 2012, pp. 108-113
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Real-space strain mapping of SOI features using microbeam X-ray diffraction
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- Powder Diffraction / Volume 23 / Issue 2 / June 2008
- Published online by Cambridge University Press:
- 29 February 2012, pp. 106-108
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PROBING STRAIN FIELDS ABOUT THIN FILM STRUCTURES USING X-RAY MICRODIFFRACTION
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- Journal:
- MRS Online Proceedings Library Archive / Volume 795 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, U7.3
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- 2003
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Mechanisms for Microstructure Evolution in Electroplated Copper Thin Films
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- MRS Online Proceedings Library Archive / Volume 562 / 1999
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- 10 February 2011, 223
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- 1999
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Mechanisms for Microstructure Evolution in Electroplated Copper Thin Films
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- MRS Online Proceedings Library Archive / Volume 564 / 1999
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- 10 February 2011, 387
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- 1999
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Thermal and Electromigration Strain Distributions in 10 μm-Wide Aluminum Conductor Lines Measured by X-Ray Microdiffraction
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- Journal:
- MRS Online Proceedings Library Archive / Volume 473 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 273
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- 1997
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Local and Global Stress Distributions in BEOL Metallization
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- MRS Online Proceedings Library Archive / Volume 428 / 1996
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- 15 February 2011, 565
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- 1996
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X-Ray Microdiffraction for VLSI
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- Journal:
- MRS Online Proceedings Library Archive / Volume 427 / 1996
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- 15 February 2011, 35
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- 1996
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Inhomogeneous Deformation in Thin Films
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- Journal:
- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 627-635
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- 1995
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Grain Orientation Mapping and Spatially Resolved Strain Measurements for Polycrystalline Films by X-Ray Microdiffraction
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- MRS Online Proceedings Library Archive / Volume 403 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 213
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- 1995
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